Electron Holographic Tomography of Mean Free Path Lengths at the nm-scale

Electron Holographic Tomography of Mean Free Path Lengths at the nm-scale

Electron mean free path in elemental metals

The electron mean free path k and carrier relaxation time s of the twenty most conductive elemental metals are determined by numerical integration over the Fermi surface obtained from first-principles, using constant k or s approximations and wave-vector dependent Fermi velocities vf (k). The average vf deviates considerably from the free-electron prediction, even for elements with spherical Fe...

Holographic free-electron light source

Recent advances in the physics and technology of light generation via free-electron proximity and impact interactions with nanostructures (gratings, photonic crystals, nano-undulators, metamaterials and antenna arrays) have enabled the development of nanoscale-resolution techniques for such applications as mapping plasmons, studying nanoparticle structural transformations and characterizing lum...

Tomography of scale-free networks and shortest path trees.

In this paper we model the tomography of scale-free networks by studying the structure of layers around an arbitrary network node. We find, both analytically and empirically, that the distance distribution of all nodes from a specific network node consists of two regimes. The first is characterized by rapid growth, and the second decays exponentially. We also show analytically that the nodes de...

Electron inelastic mean free path in solids as determined by electron Rutherford back-scattering

Electron inelastic mean free path in solids as determined by electron Rutherford back-scattering M.R. Went a,∗, M. Vos a, R.G. Elliman b a Atomic and Molecular Physics Laboratories, Research School of Physical Sciences and Engineering, The Australian National University, Canberra, ACT 0200, Australia b Electronic Materials Engineering, Research School of Physical Sciences and Engineering, The A...